automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices
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automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices

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Published by U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. in Washington .
Written in English

Subjects:

  • Semiconductors -- Testing -- Equipment and supplies.,
  • Semiconductor wafers -- Testing.,
  • Silicon -- Electric properties.,
  • Semiconductor industry -- Automation.

Book details:

Edition Notes

Includes bibliographical references.

StatementDavid L. Blackburn.
SeriesSemiconductor measurement technology, NBS special publication ; 400-52, NBS special publication ;, 400-52.
Classifications
LC ClassificationsQC100 .U57 no. 400-52, TK7871.85 .U57 no. 400-52
The Physical Object
Paginationiv, 35 p. :
Number of Pages35
ID Numbers
Open LibraryOL4062769M
LC Control Number79600178

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